JEOL IT 200LV SEM & EDX

Capability

• This equipment uses high-energy electrons for high resolution image and elemental analysis.

Specifications

• Magnifications up to 300,000X
• Modes of imaging:
  Scattered Electron
  Back Scattered Electron
• Specimen diameter of up to 150 mm can be accommodated
• Quantitative elemental detection can be carried out using EDX

Applications

• Surface morphology analysis of materials science, medical and biological samples
• Crystallographic orientation analysis of bulk materials
• Qualitative and quantitative elemental analysis from sodium to uranium